Title:
Ｘ線位相コントラストトモシンセシス撮像に対する検出器及び撮像システム
Document Type and Number:
Japanese Patent JP6688795
Kind Code:
B2
Abstract:
The invention relates to an X-ray detector arrangement (10) for X-ray phase contrast tomo-synthesis imaging, a line detector (1) for X-ray phase contrast tomo-synthesis imaging, an imaging system (24) for X-ray phase contrast tomo-synthesis imaging, a method for X-ray phase contrast tomo-synthesis imaging, and a computer program element for controlling such arrangement and a computer readable medium having stored such computer program element. The X-ray detector arrangement (10) comprises several line detectors (1). Each line detector (1) is configured to detect a Moiré pattern in at least a portion of an X-ray beam (2) impacting such line detector (1). Each line detector (1) comprises several detector lines (11), wherein a width W of each line detector (1) equals one period or an integer multiple of the period of the Moiré pattern.
Inventors:
Rothru Ewald
Application Number:
JP2017525975A
Publication Date:
April 28, 2020
Filing Date:
November 17, 2015
Export Citation:
Assignee:
KONINKLIJKE PHILIPS N.V.
International Classes:
A61B6/00; A61B6/02; G01N23/04; G01N23/20
Domestic Patent References:
| JP2012143550A | ||||
| JP2013164339A | ||||
| JP2014155509A |
Foreign References:
| WO2013111050A1 | ||||
| US20100091947 |
Attorney, Agent or Firm:
Fueda Shusen
Takahiro Igarashi
Takahiro Igarashi