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Patent Searching and Data


Title:
X線検出器用の測定回路、ならびに対応する方法およびX線撮像システム
Document Type and Number:
Japanese Patent JP6710759
Kind Code:
B2
Abstract:
There is provided a measurement circuit (30) for an x-ray detector (5). The measurement circuit (30) is configured to sample measurement data to generate data points and process the data points before read-out to produce new data points by combining two or more data points which have been acquired at different times such that the number of data points for read-out are less than the number of original data points.

Inventors:
Martin, Shereen
Application Number:
JP2018530546A
Publication Date:
June 17, 2020
Filing Date:
May 03, 2016
Export Citation:
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Assignee:
PRISMATIC SENSORS AB
International Classes:
A61B6/03
Domestic Patent References:
JP2001524862A
JP2015013107A
Foreign References:
WO2013191001A1
Other References:
Ron WARNER,ポリフェーズフィルタの基本を知る(1/3),EDN Japan,2010年 9月 1日,URL,http://ednjpapn.com/edn/articales/1009/01/news112.html
Attorney, Agent or Firm:
Hiroyuki Nagai
Yukitaka Nakamura
Yasukazu Sato
Satoru Asakura
Jie Yamanoi