Title:
自動分析装置
Document Type and Number:
Japanese Patent JP6719227
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an automatic analyzer with which it is possible to carry out maintenance while suppressing a reduction in inspection efficiency or work efficiency and thereby maintain the reliability of analysis results.SOLUTION: The automatic analyzer comprises: a specimen rack conveyance line for conveying a specimen rack between a specimen rack input unit for inputting a specimen rack having a sample container mounted therein and a specimen rack collection unit; one or more analysis units, arranged along the specimen rack conveyance line, for executing an analysis process by a plurality of analysis elements; and a controller for defining, with respect to a maintenance process of a plurality of analysis elements constituting the analysis unit, a plurality of maintenance groups including at least one maintenance process, and when a determination start condition predefined for the operating state of the analysis unit is satisfied, executes the maintenance process of a maintenance group of which the attainment factor of a maintenance execution condition predefined for the operating state of the analysis unit exceeds a predefined threshold.SELECTED DRAWING: Figure 4
Inventors:
Kenichi Yagi
Toshihide Orihashi
Toshihide Orihashi
Application Number:
JP2016029991A
Publication Date:
July 08, 2020
Filing Date:
February 19, 2016
Export Citation:
Assignee:
Hitachi High-Tech Co., Ltd.
International Classes:
G01N35/00
Domestic Patent References:
| JP2011149747A | ||||
| JP2015108641A | ||||
| JP2004271265A |
Foreign References:
| WO2017033597A1 | ||||
| WO2012120755A1 |
Attorney, Agent or Firm:
Kaichi International Patent Office