Title:
ピクセル非一様性補正
Document Type and Number:
Japanese Patent JP6768452
Kind Code:
B2
Abstract:
A method of correcting pixel non-uniformity for varying temperature includes determining an FPA temperature and calculating a non-uniformity correction map on a pixel by pixel basis for the FPA (102), wherein the non-uniformity correction for each pixel is a function of the FPA temperature and empirically derived coefficients. The method also includes applying the non-uniformity correction map at the FPA temperature to condition output of the FPA to produce temperature dependent non-uniformity corrected image data. An imaging system includes a focal plane array (FPA). A temperature sensor (106) is operatively connected to measure FPA temperature. A module (112) is operatively connected to the FPA and temperature sensor to calculate and apply a non-uniformity correction map as described above. There need be no temperature control device for the FPA. The FPA can include a buffered current mirror pixel architecture, and can include an InGaAs material for infrared imaging.
Inventors:
Jonathan Nazemi
Application Number:
JP2016217877A
Publication Date:
October 14, 2020
Filing Date:
November 08, 2016
Export Citation:
Assignee:
Sensors Unlimited Incorporated
International Classes:
G01J1/44; G01J1/02; H04N5/33; H04N5/357; H04N5/369
Domestic Patent References:
| JP2001289712A | ||||
| JP2003532111A | ||||
| JP2005236550A | ||||
| JP2006013885A |
Foreign References:
| US20140340154 |
Attorney, Agent or Firm:
Hiromichi Kobayashi
Tomioka Kiyoshi
Tomioka Kiyoshi