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Title:
顕微画像分析装置用管理プログラム及び顕微画像分析装置用管理装置
Document Type and Number:
Japanese Patent JP6777096
Kind Code:
B2
Abstract:
The present invention provides a management program and apparatus for an analyzing device, that can display descriptions relating to an operation method in a user-friendly manner, even if the number of operation items increases and a display screen is complicated. An analysis system according to the present invention includes an analyzing device 1 and a controller 2 connected to the analyzing device 1. On the controller 2, a general-purpose operating system (OS) is running, and analyzing device control software 11 is executed on the OS. The analyzing device control software 11 and an analyzing device management program 12 are stored in a storage section 10. The analyzing device management program 12 makes a CPU operate as an operation pane display section 13, an explanation pane display section 14, and a distinguishing display section 15.

Inventors:
Naoya Fujiwara
Misa Yamashita
Tomohiro Hirama
Okada Aiko
Application Number:
JP2017554688A
Publication Date:
October 28, 2020
Filing Date:
December 07, 2015
Export Citation:
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Assignee:
SHIMADZU CORPORATION
International Classes:
G01N21/27
Domestic Patent References:
JP2010512508A
JP2013072997A
JP2010085421A
JP2007102190A
Attorney, Agent or Firm:
Kyoto International Patent Office