Title:
太陽電池検査装置および太陽電池検査方法
Document Type and Number:
Japanese Patent JP6829099
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To calculate a resistance value of a series resistor that is connected to a bypass diode of a solar cell equivalently, in a power generation state.SOLUTION: A solar cell inspection device comprises: a diode 2 which is connected between a positive electrode and a negative electrode of a solar cell string 12 and short-circuits the solar cell string 12 with a polarity allowing the passage of a current I outputted from the solar cell string 12 in a power generation state; a voltage application section 3 capable of applying a test voltage Vtst which makes a potential of the negative voltage high when a potential of the positive electrode is defined as a reference and which has a voltage value exceeding a total sum of forward voltages of multiple bypass diodes 24, between the positive electrode and the negative electrode of the solar cell string 12 in a short-circuit state; a current detection section 5 which detects the current I; and a processing section 6 which calculates a resistance value R(=(V1-V2)/(I1-I2)) from a first current value I1 and a first voltage value V1 in the case where the test voltage Vtst is the first voltage value V1, and a second current value I2 and a second voltage value V2 in the case where the test voltage is the second voltage value V2.SELECTED DRAWING: Figure 1
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Inventors:
Masao Higuchi
Akihiko Miki
Yusuke Abe
Hidenori Himeno
Akihiko Miki
Yusuke Abe
Hidenori Himeno
Application Number:
JP2017026606A
Publication Date:
February 10, 2021
Filing Date:
February 16, 2017
Export Citation:
Assignee:
Hioki Electric Co., Ltd.
International Classes:
H02S50/10
Domestic Patent References:
| JP2011066320A | ||||
| JP2013065797A | ||||
| JP2013080745A | ||||
| JP2016213955A |
Foreign References:
| WO2014007261A1 | ||||
| US20110032099 |
Attorney, Agent or Firm:
Shinji Sakai