Title:
撮像装置
Document Type and Number:
Japanese Patent JP6837640
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an imaging device by which a good image can be shot even under a radiation environment.SOLUTION: An imaging device comprises: a solid imaging unit 1 having pixels each composed of a PG(photogate) type CMOS image pickup element; dark current-detection means 2 for detecting a dark current based on a voltage level obtained with each image pickup element put in a light shielding state; PG voltage control means 6 for reducing the dark current by controlling a PG voltage of each image pickup element on condition that a dark current has been detected; correction coefficient-deciding means for deciding a correction coefficient based on a voltage level obtained with each image pickup element put in a non-light shielding state on condition that no dark current has not been detected by the dark current-detection means; and brightness gradation control means 3 for performing correction by use of the correction coefficient decided by the voltage level output by the image pickup element, thereby controlling the brightness gradation of finally output video signals. The PG voltage control means is set to a PG voltage according to a level of such a saturation electric charge amount that fluctuation is caused when the PG voltage is changed by a predetermined value.SELECTED DRAWING: Figure 1
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Inventors:
Shinichi Kato
Takeuchi Banteru
Kunihiko Tsuchiya
Yasushi Watanabe
Takeuchi Banteru
Kunihiko Tsuchiya
Yasushi Watanabe
Application Number:
JP2017058161A
Publication Date:
March 03, 2021
Filing Date:
March 23, 2017
Export Citation:
Assignee:
Ikegami Tsushinki Co., Ltd.
Japan Atomic Energy Agency
Brookman Technology Co., Ltd.
Japan Atomic Energy Agency
Brookman Technology Co., Ltd.
International Classes:
H04N5/361; H01L27/146; H04N5/243; H04N5/374
Domestic Patent References:
| JP6177417A | ||||
| JP60065565A | ||||
| JP2007036353A |
Foreign References:
| WO2016013227A1 |
Attorney, Agent or Firm:
Patent Business Corporation Tani/Abe Patent Office