磁性異物検査装置および磁性異物検査システム

Japanese Patent JP6842164

B2

PROBLEM TO BE SOLVED: To provide a foreign substance inspection device which does not need a magnetic shield when inspecting a magnetic foreign substance, is applicable to a large device in which the distance between the sensor and an inspection object is relatively large, and can make a highly precise detection even when a large amount of inspection target object is processed or when a detection target is a magnetic foreign substance mixed in the inside of the inspection target object.SOLUTION: The foreign substance inspection device includes: magnetic field generating means; a plate-like soft magnetic member; and a magnetic sensor having a directivity in the direction in which the magnetic field is detected. The magnetic field generating means applies a magnetic field to an inspection region containing an inspection target object. The soft magnetic member is arranged so that one main surface is in contact with the magnetic field generating means. The magnetic sensor is arranged near another main surface of the soft magnetic member and is arranged so that the directivity exists in the tangential direction of another main surface.SELECTED DRAWING: Figure 1

JP2006103834	CONVEYOR BELT
WO/2008/068972	FOLLOW-UP DEVICE FOR DETECTING FLAW OF PIPE AND AUTOMATIC FLAW DETECTION APPARATUS OF PIPE EMPLOYING IT
JPH11311617	METHOD AND APPARATUS FOR DIAGNOSIS OF DEFECTS

Masahiro Nakai

JP2017040118A

March 17, 2021

March 03, 2017

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Miyagi Prefecture

G01N27/83; G01R33/02

JP2014159984A
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JP2016180701A
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US20160282500

中居 倫夫,高周波キャリア型薄膜磁気センサを用いた微粒子異物の検出,電気学会フィジカルセンサ研究会資料,日本,一般社団法人 電気学会,2016年 6月30日,PHS-16, 13-17,11-20
中居 倫夫 他,高周波キャリア型磁界センサにおける傾斜磁区制御方法とインピーダンス特性,日本応用磁気学会誌,日本,日本応用磁気学会,2003年 3月26日,Vol.27, No.7,832-838

Kenho Ikeda
Takashi Sasaki

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