Title:
変位計測方法、前記変位計測方法に用いる計測装置、および前記変位計測方法を実施する計測システム
Document Type and Number:
Japanese Patent JP6892097
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a displacement measurement method, a measurement device used for executing the displacement measurement method, and a displacement measurement system for executing the displacement measurement method.SOLUTION: A measurement device is used for measuring relative displacement of two positions between which a crack of a crack measurement object portion of a measurement object is held. The measurement device has: a first tabular lattice having a lattice pattern, fixed to a region containing the two position, and deforming following the relative displacement of the two positions in the object portion; and a second tabular lattice having a lattice pattern, arranged in the vicinity or periphery of the first tabular lattice, and fixed to any one-side region of the two positions.SELECTED DRAWING: Figure 2
Inventors:
Yoshiharu Morimoto
Yoshiyuki Kusunoki
Sumiya Meiji University
Hiroshi Takagi
Ueki Masaki
Yoshiyuki Kusunoki
Sumiya Meiji University
Hiroshi Takagi
Ueki Masaki
Application Number:
JP2016159741A
Publication Date:
June 18, 2021
Filing Date:
August 16, 2016
Export Citation:
Assignee:
4d Sensor Co., Ltd.
International Classes:
G01B11/14; G01B11/16; G06T7/00
Domestic Patent References:
| JP2002340529A | ||||
| JP2015184043A |
Attorney, Agent or Firm:
Aiwa Patent Business Corporation