Title:
検体検査自動化システム
Document Type and Number:
Japanese Patent JP6931653
Kind Code:
B2
Abstract:
The present invention is provided with: an automatic analysis device 200 for performing an analysis process to analyze a specimen that is to be analyzed; a specimen pre-processing module 100 for performing pre-processing to cause the specimen to enter a state in which the analysis process can be performed; a main conveyance line 161 for conveying a specimen container carrier 10 which accommodates the specimen that is to be analyzed and in which at least one specimen container can be mounted; and annular conveyance lines 111, 121, 131, 141, 151, 411 that are disposed adjacent to the main conveyance line 161 and that are moreover disposed so as to be capable of transferring the specimen container carrier 10 to and from the main conveyance line 161, the annular conveyance lines 111, 121, 131, 141, 151, 411 being capable of circulating and conveying the specimen container carrier 10 separately without the use of another conveyance line (e.g., a return line 162). This makes it possible to maintain flexibility in conveyance of specimens while suppressing increases in device surface area.
Inventors:
Shigeru Yamaguchi
Naoto Tsujimura
Tomoyuki Nemoto
Naoto Tsujimura
Tomoyuki Nemoto
Application Number:
JP2018540652A
Publication Date:
September 08, 2021
Filing Date:
July 18, 2017
Export Citation:
Assignee:
Hitachi High-Tech Co., Ltd.
International Classes:
G01N35/04
Domestic Patent References:
JP2010526289A | ||||
JP1168866U | ||||
JP2004279357A | ||||
JP2013148428A | ||||
JP2010181384A | ||||
JP2014085148A | ||||
JP2015078923A | ||||
JP11500224A | ||||
JP61274268A |
Foreign References:
DE19853184A1 | ||||
DE1798481A1 | ||||
WO2012114675A1 |
Attorney, Agent or Firm:
Kaichi International Patent Office