Title:
ひび割れ解析装置、ひび割れ解析方法、及び、ひび割れ解析プログラム
Document Type and Number:
Japanese Patent JP6937355
Kind Code:
B2
Abstract:
A crack analysis device includes a captured image acquiring unit, a crack detecting unit, and a crack ratio calculator. The captured image acquiring unit acquires a captured image which is obtained by imaging a road surface. The crack detecting unit detects cracks in the imaged road surface on the basis of the captured image. The crack ratio calculator calculates a crack ratio indicating a ratio of an area of the cracks to a predetermined area on the basis of the detected cracks.
Inventors:
Yoko Yonekawa
Nobuyuki Kumakura
Yasuhiko Yamazaki
Shingo Anami
Nobuyuki Kumakura
Yasuhiko Yamazaki
Shingo Anami
Application Number:
JP2019226653A
Publication Date:
September 22, 2021
Filing Date:
December 16, 2019
Export Citation:
Assignee:
Toshiba Corporation
Toshiba Infrastructure Systems & Solutions Corporation
Toshiba Infrastructure Systems & Solutions Corporation
International Classes:
E01C23/01; G08G1/00
Domestic Patent References:
| JP2013079889A | ||||
| JP2008046065A | ||||
| JP2015007341A | ||||
| JP2006112127A | ||||
| JP2007249103A | ||||
| JP2013139671A | ||||
| JP2014089078A |
Foreign References:
| US20060274930 |
Attorney, Agent or Firm:
Shiga International Patent Office