Title:
高次脳機能検査用の三次元表示装置、高次脳機能検査用の三次元表示方法、および高次脳機能検査用の三次元表示プログラム
Document Type and Number:
Japanese Patent JP6941833
Kind Code:
B2
Abstract:
To provide a three-dimensional display device, a three-dimensional display method and a three-dimensional display program for high order brain function inspection capable of properly inspecting a space recognition ability.SOLUTION: A three-dimensional display device 100 for high order brain function inspection comprises: a recording part 200 for recording a subject history 210, a TMT history and/or BIT history 230 and high order brain function inspection program information; a three-dimensional display part 300; and a control part 500 for controlling display of the three-dimensional display part 300. The control part 500 selects the high order brain function inspection program information based on at least the subject history 210 of the subject, any or both of the TMT history and/or BIT history 230 recorded in the recording part 200, and displays the high order brain function inspection on the three-dimensional display part 300.SELECTED DRAWING: Figure 1
Inventors:
Takashi Sugiyama
Reo Sakamoto
Kimitaka Hase
Shingo Hashimoto
Reo Sakamoto
Kimitaka Hase
Shingo Hashimoto
Application Number:
JP2017129815A
Publication Date:
September 29, 2021
Filing Date:
June 30, 2017
Export Citation:
Assignee:
Tekurico Co., Ltd.
Kansai Medical University
Kansai Medical University
International Classes:
A61B5/00; A61B5/055
Domestic Patent References:
| JP2015213539A | ||||
| JP2000126148A | ||||
| JP2005143599A | ||||
| JP2017511891A | ||||
| JP2014506141A |
Attorney, Agent or Firm:
High Yama Yoshinari