Title:
ディスプレイの特性評価の方法および光学システム
Document Type and Number:
Japanese Patent JP7324867
Kind Code:
B2
Abstract:
The invention relates to a method for characterizing and operating a display (100), in particular a light-field display or a display with or without a phase screen, comprising: an input stage wherein at least one test signal is provided as input to the display (100), a capture stage for obtaining display output information, said capture stage comprising capturing, by at least one acquisition system (104) placed at a distance from the display, an impulse response of the display (101) in response to the at least one provided test signal, wherein said capturing of an impulse response comprises measuring the at the at least one acquisition system (104) received intensity distribution of the light emitted by the display (101) in response to the at least one test signal, and/or capturing the wavefront phase of the light emitted by the display (101) in response to the at least one test signal.
Inventors:
Carmona Valestel, David
Trujillo Seville, Juan Manuel
Bonak Gonzalez, Sergio
Rodriguez Ramos, Jose Manuel
Trujillo Seville, Juan Manuel
Bonak Gonzalez, Sergio
Rodriguez Ramos, Jose Manuel
Application Number:
JP2021565997A
Publication Date:
August 10, 2023
Filing Date:
April 29, 2020
Export Citation:
Assignee:
Wooptics Sociedad Limitada
International Classes:
H04N17/04; G01M11/00; G02B30/33; H04N13/307
Domestic Patent References:
| JP3180075U | ||||
| JP2013539078A |
Foreign References:
| US20120008181 |
Attorney, Agent or Firm:
Patent Attorney Corporation Shinei Office