Title:
補償光学ラインビーム走査結像の非アイソプラナティック収差補正方法及び装置
Document Type and Number:
Japanese Patent JP7349025
Kind Code:
B2
Abstract:
An anisoplanatic aberration correction method and apparatus for adaptive optical linear beam scanning imaging. The method comprises: in an adaptive optical linear beam scanning imaging system, performing temporal correction on an anisoplanatic region aberration in a linear beam scanning direction, and performing regional correction on an anisoplanatic region aberration in a linear beam direction. According to the method, the limitation of an isoplanatic region on an adaptive optical imaging field of view can be overcome, and wide field of view aberration correction and high-resolution imaging of a retina is realized. According to the provided method and apparatus for temporal and regional correction of a wide field of view anisoplanatic aberration, the wide field of view aberration correction can be completed by means of only a single wavefront sensor and a single wavefront corrector, such that almost none of the system complexities is increased. The provided correction of an image subjected to deconvolution is low in cost. By means of regional deconvolution of wavefront aberration information, the adaptive optical aberration correction can be compensated to the greatest possible extent, the correction effect is good, and online processing or post-processing can be performed, and correction is flexible and convenient.
Inventors:
what benefit
▲陳▼ 一巍
▲刑▼ 利娜
hole sentence
史 国▲華▼
▲陳▼ 一巍
▲刑▼ 利娜
hole sentence
史 国▲華▼
Application Number:
JP2022531633A
Publication Date:
September 21, 2023
Filing Date:
June 15, 2021
Export Citation:
Assignee:
SUZHOU INSTITUTE OF BIOMEDICAL ENGINEERING AND TECHNOLOGY, CHINESE ACADEMY OF SCIENCES
International Classes:
A61B3/10; A61B3/12
Domestic Patent References:
| JP2016158708A |
Foreign References:
| CN110794577A | ||||
| CN103054550A |
Attorney, Agent or Firm:
Patent Attorney Corporation Asahina Patent Office