Title:
分析支援装置、分析支援方法および分析支援プログラム
Document Type and Number:
Japanese Patent JP7415771
Kind Code:
B2
Abstract:
An analysis assistance device includes an estimator that estimates distribution of measurement quality index data using a plurality of analysis condition data to be provided to an analysis device and a plurality of measurement data obtained in the analysis device based on the plurality of analysis condition data, a calculator that calculates the measurement quality index data from the measurement data obtained from the analysis device, and a comparison outputter that compares and outputs for display the measurement quality index data estimated by the estimator and the measurement quality index data calculated by the calculator.
Inventors:
Satoru Watanabe
Application Number:
JP2020077306A
Publication Date:
January 17, 2024
Filing Date:
April 24, 2020
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
G01N30/02; G01N30/86
Domestic Patent References:
| JP2012163476A | ||||
| JP2300660A | ||||
| JP7151743A | ||||
| JP6324029A | ||||
| JP2014098672A |
Foreign References:
| EP2270491A1 | ||||
| US5209853 | ||||
| US20140156612 |
Attorney, Agent or Firm:
Masahiro Nakagawa
Yoshito Fukushima
Go Sakane
Hideyuki Sawamura
Yoshito Fukushima
Go Sakane
Hideyuki Sawamura