Title:
非破壊検査システム、中性子照射源及び中性子照射方法
Document Type and Number:
Japanese Patent JP7428865
Kind Code:
B2
Abstract:
A non-destructive inspection system 1 includes a neutron radiation source 3 capable of emitting neutrons N, and a neutron detector 14 capable of detecting neutrons Nb produced via an inspection object 6a among neutrons N emitted from the neutron radiation source 3. The neutron radiation source 3 includes a linear accelerator 11 capable of emitting charged particles P accelerated; a first magnet section 12 including magnets 12a and 12b facing each other, the magnets 12a and 12b being capable of deflecting the charged particles P in a direction substantially perpendicular to a direction of emission of the charged particles P from the linear accelerator 11; and a target section 13 capable of producing neutrons N by being irradiated with the charged particles P that have passed through the first magnet section 12.
Inventors:
Shigenori Nagano
Hiroshi Tsukada
Yoshie Ohtake
Koji Imon
Yuichi Yoshimura
Hideyuki Sunaga
Hiroshi Tsukada
Yoshie Ohtake
Koji Imon
Yuichi Yoshimura
Hideyuki Sunaga
Application Number:
JP2023001502A
Publication Date:
February 07, 2024
Filing Date:
January 10, 2023
Export Citation:
Assignee:
Topcon Co., Ltd.
RIKEN
RIKEN
International Classes:
G01N23/204; H05H7/04
Domestic Patent References:
JP2013150809A | ||||
JP2008521207A | ||||
JP4504174A | ||||
JP11297498A | ||||
JP200193700A | ||||
JP495900A | ||||
JP201250698A | ||||
JP501789A |
Foreign References:
WO2016035151A1 | ||||
WO2017043581A1 |
Attorney, Agent or Firm:
Naoki Maekawa