Document Type and Number:
Japanese Patent JPH0211873
Kind Code:
B2
Abstract:
An integrated circuit is operable to produce a first signal of at least three voltage levels at an output terminal thereof for driving a liquid crystal during a normal mode of operation and is operable to change the first signal to a second signal of two voltage levels for use in testing the first signal during a test mode of operation. The integrated circuit comprises a logic circuit for generating a reference signal and an effective signal to control the driving of the liquid crystal, test circuitry for producing a test signal during the test mode, a drive control circuit receptive of the reference signal and the effective signal for producing normal drive control signals in the absence of the test signal and for producing test drive control signals in response to the test signal, and a set of analogue switches responsive to the drive control signals for producing the first signal of at least three voltage levels when the test circuitry does not produce the test signal and for producing the second signal of two voltage levels when the test circuitry produces the test signal. During the test mode, the second signal of two voltage levels is applied to a conventional LSI tester incorporated in the LSI circuitry which includes the integrated circuit, and the LSI tester utilizes the two voltage levels of the second signal to test the operational state of the LSI circuitry.
Inventors:
ISHIKAWA TAKEHIRO
Application Number:
JP14588781A
Publication Date:
March 16, 1990
Filing Date:
September 16, 1981
Export Citation:
Assignee:
SEIKO INSTR & ELECTRONICS
International Classes:
G01R31/28; G01R31/3167; G01R31/3185; G01R31/319; G04D7/00; G06F11/267
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