Title:
【考案の名称】高周波半導体素子の測定治具
Document Type and Number:
Japanese Patent JPH04134081
Kind Code:
U
Inventors:
Ogawa Kazunori
Application Number:
JP4006791U
Publication Date:
December 14, 1992
Filing Date:
May 31, 1991
Export Citation:
International Classes:
G01R31/26; H01R33/76; (IPC1-7): G01R31/26
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