Title:
【発明の名称】絶対的なモアレ距離を測定するための方法及び装置
Document Type and Number:
Japanese Patent JPH05502732
Kind Code:
A
Abstract:
Method and apparatus are disclosed for providing absolute Moire distance measurements of a diffusely reflective surface from a reference position. More particularly, a first grating is located, formed, or printed on the diffusely reflective surface. An image of the first grating is formed on a second grating or detector array by imaging means for generating a Moire pattern that is detected by a detector means. At the reference position of the diffusely reflective surface relative to the imaging means, the periods of the image of the first grating and the second grating match. Movement of the diffusely reflective surface from the reference position in a direction normal thereto, produces a spatially varying intensity pattern at the detector means which results from the shifting and magnification mismatch between the pattern of the image of the first grating and the pattern of the second grating. Measuring the amount of magnification differences between the two patterns provides information related to the instantaneous absolute distance of the diffusely reflective surface from the reference position. Various methods are disclosed for using the information from the detector means for determining the absolute distance measurements.
Inventors:
Greven Kamp, John Yee, Jr.
Rumsel Jay, Palm
Kevin Gee, Sullivan
Rumsel Jay, Palm
Kevin Gee, Sullivan
Application Number:
JP51616991A
Publication Date:
May 13, 1993
Filing Date:
September 17, 1991
Export Citation:
Assignee:
Eastman Kodak Company
International Classes:
G01B11/00; G01B11/02; G01D5/26; G01D5/38; G01S17/89; G02B7/28; (IPC1-7): G01B11/00; G01D5/26
Attorney, Agent or Firm:
Kyozo Yuasa (6 people outside)