Document Type and Number:
Japanese Patent JPS5421742
Kind Code:
B1
Abstract:
This invention relates to a method and a device for measuring minima or maxima of the thickness of a dielectric layer on electric conductor means having prominent portions, wherein a measuring head scans the surface of the layer and minima or maxima of the thickness of the dielectric layer are detected, stored and indicated. Several minima or maxima may simultaneously be indicated and compared with each other whereby it is possible to determine the general position of the conductor means in a dielectric and absolute extremum values of the thickness.
Application Number:
JP2713471A
Publication Date:
August 01, 1979
Filing Date:
April 24, 1971
Export Citation:
International Classes:
G01B7/00; G01B7/06; G01B7/14; G01B7/28; G01N7/06; G01R33/00; H01B13/00; G01B; (IPC1-7): G01B7/10; H01B13/00