Title:
テストパターン生成方法、装置及びプログラム
Document Type and Number:
Japanese Patent JPWO2009087769
Kind Code:
A
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Inventors:
Daisuke Maruyama
Application Number:
JP2008050181W
Publication Date:
July 16, 2009
Filing Date:
January 10, 2008
Export Citation:
Assignee:
富士通株式会社
International Classes:
G01R31/28; G01R31/3183
Attorney, Agent or Firm:
Susumu Takeuchi