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Title:
レイリー測定システムおよびレイリー測定方法
Document Type and Number:
Japanese Patent JPWO2017154190
Kind Code:
A1
Abstract:
レイリー散乱光の周波数領域での初期データと対象データの相関を求める場合に、初期データ測定から得た初期レイリー散乱スペクトル（ＲＳＳ）の解析結果と対象データ測定から得た対象ＲＳＳの解析結果を比較することにより、先に得た対象ＲＳＳの解析結果の距離補正を行い、距離補正後の対象ＲＳＳと初期ＲＳとの相関係数を基に、レイリースペクトルシフトを求める。

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Inventors:
Kishida Kinmasu
Yoshiaki Yamauchi
Application Number:
JP2018503957A
Publication Date:
October 04, 2018
Filing Date:
March 11, 2016
Export Citation:
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Assignee:
Neubrex Co., Ltd.
International Classes:
G01D5/353
Domestic Patent References:
JP2001507446A2001-06-05
JP2004069685A2004-03-04
JP4441624B22010-03-31
JP2011017652A2011-01-27
Foreign References:
WO2010061718A12010-06-03
Attorney, Agent or Firm:
Masuo Oiwa
Kenji Yoshizawa



 
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