Document Type and Number:
Japanese Patent JPWO2022054163
Kind Code:
A1
Abstract:
An abnormality detection system includes: shape data acquisition means for acquiring shape data of a surface of a structure; surface direction calculation means for calculating a direction in which the surface is facing based on the shape data; shape data division means for dividing the shape data based on the direction in which the surface is facing calculated by the surface direction calculation means; reference shape calculation means for calculating a reference shape for each of the pieces of the shape data divided by the shape data division means; and abnormality detection means for detecting an abnormality on the surface of the structure based on a difference between each of the pieces of the shape data divided by the shape data division means and the reference shape corresponding to each of the pieces of the shape data calculated by the reference shape calculation means.
Application Number:
JP2022548290A
Publication Date:
March 17, 2022
Filing Date:
September 09, 2020
Export Citation:
