Title:
THREE-DIMENSIONAL SHAPE MEASURING METHOD AND THREE-DIMENSIONAL SHAPE MEASURING DEVICE
Document Type and Number:
Japanese Patent JP2022103956
Kind Code:
A
Abstract:
To provide a three-dimensional shape measuring method and a three-dimensional shape measuring device that can easily change a measuring range and measure accurately, the three-dimensional shape of an object.SOLUTION: A three-dimensional shape measuring method includes the steps of: projecting a grating pattern formed by light from a projector toward an object placed on a reference surface; picking up an image of the grating pattern projected on the object with a camera to obtain a picked-up image; performing phase analysis of a lattice image for the picked-up image to calculate information on a height of the object; and adjusting a position of the projector or the camera to reduce a distance between the projector and the camera when increasing a range for measuring the height information, and increase the distance between the projector and the camera when reducing the measuring range.SELECTED DRAWING: Figure 5
Inventors:
NARIMATSU SHUJI
HORIGUCHI HIROSADA
HORIGUCHI HIROSADA
Application Number:
JP2020218884A
Publication Date:
July 08, 2022
Filing Date:
December 28, 2020
Export Citation:
Assignee:
SEIKO EPSON CORP
International Classes:
G01B11/25
Attorney, Agent or Firm:
Satoshi Nakai
Hiroki Matsuoka
Masayuki Imamura
Hiroki Matsuoka
Masayuki Imamura
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