Title:
ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION METHOD, AND PROGRAM
Document Type and Number:
Japanese Patent JP2018051721
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To accurately detect an abnormality of an abnormality.SOLUTION: An abnormality detection device includes: acquisition means which acquires measured data of a measured value measured by a first sensor for measuring prescribed physical quantity in an apparatus or around the apparatus; determination means which determines whether or not a specific event which is different from an abnormality and affects the measured value by the first sensor is generated at a measurement timing on the basis of information indicating a state of the apparatus or a state around the apparatus at the measurement timing of the object measured data acquired as an abnormality detection object; control means which controls not to perform abnormality detection processing using the object measured data when determining that the specific event is generated at the measurement timing and controls to perform the abnormality detection processing using the object measured data when determining that the specific event is not generated; and abnormality detection means which detects an abnormality on the basis of the object measured data in accordance with the control of the control means.SELECTED DRAWING: Figure 4
Inventors:
FUTAKI HAJIME
Application Number:
JP2016193624A
Publication Date:
April 05, 2018
Filing Date:
September 30, 2016
Export Citation:
Assignee:
CANON KK
International Classes:
B25J19/06; G05B23/02
Attorney, Agent or Firm:
Takayoshi Kokubun
Previous Patent: A manufacturing method of a ring, and a polish device of a ring
Next Patent: Tapered ball end mill
Next Patent: Tapered ball end mill