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Title:
ABNORMALITY DETECTION SYSTEM, ABNORMALITY DETECTION METHOD AND PROGRAM
Document Type and Number:
Japanese Patent JP2020135242
Kind Code:
A
Abstract:
To provide an abnormality detection system capable of easily estimating a cause of an abnormality in a controlled target.SOLUTION: An abnormality detection system is comprised of: a storage unit 20 that stores n pieces of parameters of a model of a controlled target, parameter values of the controlled target in a normal time, and m sorts of parameter values in an abnormal time; a parameter value estimation unit 21 that estimates a parameter value by measuring a control amount in a predetermined measurement period; and, a diagnostic unit 22 having a processing unit for evaluating a contribution rate of a measurement vector to each abnormal mode point vector, which diagnoses a degree of abnormality for each cause based on the contribution rate, while the processing unit positions a normal point corresponding to the parameter value at the normal time and m pieces of abnormal mode points related to a cause of the abnormality, which correspond to m sorts of parameter values at the abnormal time in an n-dimensional parameter space; the processing unit positions a measurement point corresponding to the parameter value at the time of measurement; and the processing unit sets a measurement vector from the normal point to the measurement point and each abnormal mode point vector from the normal point to each abnormal mode point.SELECTED DRAWING: Figure 1

Inventors:
TSUBATA HAJIME
TANAKA HITOSHI
YAMADA TAKAAKI
Application Number:
JP2019026006A
Publication Date:
August 31, 2020
Filing Date:
February 15, 2019
Export Citation:
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Assignee:
OMRON TATEISI ELECTRONICS CO
International Classes:
G05B23/02; G05B13/02
Domestic Patent References:
JP2017057712A2017-03-23
JP2017167663A2017-09-21
Foreign References:
WO2011138911A12011-11-10
US20190346817A12019-11-14
Attorney, Agent or Firm:
Takuji Yamada
Yukinori Nakakura