Title:
ABNORMALITY DETERMINATION DEVICE AND ABNORMALITY DETERMINATION METHOD
Document Type and Number:
Japanese Patent JP2023118217
Kind Code:
A
Abstract:
To provide an abnormality determination device and the like capable of easily and accurately determining abnormalities in component supply equipment for component mounting.SOLUTION: An abnormality determination device 110 is an abnormality determination device 110 capable of determining an abnormality of a feeder 7 that sequentially supplies multiple components P to a component mounting device M3 by sending multiple pockets 14a in which multiple components P are individually stored. The abnormality determination device includes: an acquisition unit 111 that acquires position information regarding a supply position of the relevant components P for each of the multiple components P sequentially supplied by the feeder 7 for component mounting with component mounting device M3; an estimating unit 112 that estimates a stop position of one pocket 14a in which one component P out of the multiple components P is stored by performing predetermined statistical processing on the basis of, the acquired multiple position information; and a determination unit 113 that determines the abnormality of the feeder 7 on the basis of the estimated stop position.SELECTED DRAWING: Figure 9
Inventors:
KAWAZOE MASARU
NAKAMURA MITSUO
ALEX VALDIVIELSO
NAKAMURA MITSUO
ALEX VALDIVIELSO
Application Number:
JP2022021045A
Publication Date:
August 25, 2023
Filing Date:
February 15, 2022
Export Citation:
Assignee:
PANASONIC IP MAN CORP
International Classes:
H05K13/02; H05K13/08
Attorney, Agent or Firm:
Hiromori Arai
Eisaku Teratani
Shinichi Michisaka
Eisaku Teratani
Shinichi Michisaka