Title:
ABNORMALITY DETERMINATION DEVICE AND METHOD
Document Type and Number:
Japanese Patent JP2023087849
Kind Code:
A
Abstract:
To automatically identify the occurrence of a chattering vibration abnormality during machining and a tool abrasion abnormality in a cutting process.SOLUTION: A computer 002, which is an abnormality determination device for identifying abnormalities (chattering vibration abnormality and tool abrasion abnormality) occurring during a cutting process, comprises: an input/output unit 5 that receives an operation state of a cutting facility 001 for executing the cutting process; a feature amount calculation unit 2061 that calculates feature amount data indicating a feature of the operation state; an abnormality occurrence determination unit 2062 that calculates an abnormality degree indicating deviation from a normal state of the cutting process on the basis of the feature amount data and determining whether the cutting process is in an abnormal state on the basis of the abnormality degree; and an identification unit 2063 that calculates a change degree indicating a change degree of the abnormality degree over time, and identifies the abnormality in accordance with the change degree.SELECTED DRAWING: Figure 1
More Like This:
Inventors:
YAGI DAISUKE
FUKUOKA NOBUHIKO
AKABORI TOMOHIKO
KAJIURA YOSHITO
FUKUOKA NOBUHIKO
AKABORI TOMOHIKO
KAJIURA YOSHITO
Application Number:
JP2021202363A
Publication Date:
June 26, 2023
Filing Date:
December 14, 2021
Export Citation:
Assignee:
PROTERIAL LTD
International Classes:
B23Q17/09; B23Q15/12; B23Q15/16; B23Q17/12; B23Q17/20; G05B19/18; G05B19/404
Attorney, Agent or Firm:
Polaire Patent Attorneys Corporation
Previous Patent: building fixtures
Next Patent: Patient information management system, reception device, payment device, patient information recordi...
Next Patent: Patient information management system, reception device, payment device, patient information recordi...