Title:
ABNORMALITY DIAGNOSING SYSTEM FOR PLANT
Document Type and Number:
Japanese Patent JPS6410307
Kind Code:
A
Abstract:
PURPOSE:To reduce both the cost and the time needed for collection of check data by selecting those data used in the diagnosing processes to detect sequentially the factors of abnormality. CONSTITUTION:A diagnosis knowledge setting part 101 backs up a user who describes the causal relation between all check data on an object plant and the causes of abnormality in a rule form and stores said relation into a knowledge base 108. At the same time, the user sorts those check data according to each subsystem to be checked and supplies these sorting results to an abnormality diagnosing system. Furthermore the relations are decided between the events forming said rule and the sorting items respectively. An application knowledge extracting part 102 displays the sorting results of check data on a display terminal equipment 3 and accepts the application of the data on a specific sorting item to be used from the user. Then a rule consisting of only the events having the same index as that of the designated data is extracted based on the diagnosis knowledge stored in the base 108. This extracted rule is stored in a temporary knowledge base 107.
Inventors:
KOBAYASHI TAKASHI
KURIHARA KENZO
AKASHI KICHIZO
KURIHARA KENZO
AKASHI KICHIZO
Application Number:
JP16532087A
Publication Date:
January 13, 1989
Filing Date:
July 03, 1987
Export Citation:
Assignee:
HITACHI LTD
International Classes:
G08B19/00; G05B23/02; G06Q10/04; (IPC1-7): G05B23/02; G06F15/20; G08B19/00
Attorney, Agent or Firm:
Katsuo Ogawa