Title:
ABNORMALITY DIAGNOSIS DEVICE
Document Type and Number:
Japanese Patent JP2017090320
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an abnormality diagnosis device with which it is possible to diagnose abnormality in an object device with high accuracy.SOLUTION: The abnormality diagnosis device comprises a sensor unit 2 for detecting a heat flux flowing from an object device 200 to the outside, and a determination unit 3 for determining abnormality in the object device 200. The sensor unit 2 includes a first heat flux sensor, a second heat flux sensor, and a heat buffer disposed between the first heat flux sensor and the second heat flux sensor and having a prescribed heat capacity. The first heat flux sensor outputs a first sensor signal that corresponds to a heat flux passing through the first heat flux sensor from the object device 200 side toward the heat buffer side. The second heat flux sensor outputs a second sensor signal that corresponds to a heat flux passing through the second heat flux sensor from the heat buffer side to a side apart from the object device 200. The determination unit 3 determines the presence of abnormality in the object device 200 on the basis of the first sensor signal and second sensor signal.SELECTED DRAWING: Figure 1
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Inventors:
GOKO MICHIHISA
SAKAIDA ATSUSUKE
TANIGUCHI TOSHIHISA
OKAMOTO KEIJI
SHIRAISHI YOSHIHIKO
SAKAIDA ATSUSUKE
TANIGUCHI TOSHIHISA
OKAMOTO KEIJI
SHIRAISHI YOSHIHIKO
Application Number:
JP2015222446A
Publication Date:
May 25, 2017
Filing Date:
November 12, 2015
Export Citation:
Assignee:
DENSO CORP
International Classes:
G01M99/00
Domestic Patent References:
JPH03213249A | 1991-09-18 | |||
JP2015175671A | 2015-10-05 | |||
JP2014007376A | 2014-01-16 | |||
JP2001165782A | 2001-06-22 | |||
JPH07229865A | 1995-08-29 |
Foreign References:
CN102879419A | 2013-01-16 |
Attorney, Agent or Firm:
Patent Business Corporation Yuai Patent Office