Title:
ABNORMALITY DIAGNOSTIC DEVICE
Document Type and Number:
Japanese Patent JPS58222311
Kind Code:
A
Abstract:
PURPOSE:To attain abnormality diagnosis with high accuracy and reliability, by studying the past result of abnormality diagnosis and setting a threshold value where rate of mis-information and rate of missing information are equal as an optimizing value. CONSTITUTION:When an objective plant 1 is normal, a detecting value (y) of a detector 2 is not so much different from a reference value (x), an output ¦x-y¦ of an absolute value generator 5 is smaller than a threshold value epsilon, and a comparator 6 outputs an off-signal representing the normality. If the objective plant 1 is failed, the detected value (y) differs largely from the reference value (x), becomes larger than the threshold epsilon. and the comparator 6 outputs an on-signal representing the abnormality for displaying the abnormality.
Inventors:
MURATA RIYOUICHI
Application Number:
JP10497782A
Publication Date:
December 24, 1983
Filing Date:
June 18, 1982
Export Citation:
Assignee:
MITSUBISHI HEAVY IND LTD
International Classes:
G21C17/00; G05B23/02; (IPC1-7): G21C17/00
Attorney, Agent or Firm:
Takehiko Suzue