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Title:
ADJUSTING DEVICE FOR PINHOLE OF LASER MEASURING INSTRUMENT
Document Type and Number:
Japanese Patent JPS6285837
Kind Code:
A
Abstract:

PURPOSE: To improve measuring accuracy of the titled instrument by detecting the quantity of light of laser beams passing through a pinhole at the prescribed position and performing alignment between the pinhole and the laser beams by a feedback mechanism based on the detected value.

CONSTITUTION: A part of the irradiated 1 laser beams is directed to the surface (S) of an object to be detected passing through a half mirror 6 via a diverging lens 2 and the pinhole 3 and a part of the rest is reflected on the mirror 6 and irradiated on a photodetection plate 9 and photodetected with detectors 10 (10aW10d) and converted into electrical signals in accordance with the quantities of photodetection. When these signals are compared respectively and the alignment between the pinhole 3 and an optical axis of the laser beams is adjusted and the alignment is made in an accurate state, interference fringes are formed on the laser beams via a collimator lens 4 interfering the reflected light of the surface (S) with the reflected light of a reference plate 5 and the interference fringes are reflected via the mirror 6 and received by a TV camera 8 and an image analysis is performed, by which a surface state of plane accuracy of the surface (S) can be measured.


Inventors:
ITAMOTO SHIGERU
YONEDA MASAMI
Application Number:
JP22598485A
Publication Date:
April 20, 1987
Filing Date:
October 12, 1985
Export Citation:
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Assignee:
FUJI PHOTO OPTICAL CO LTD
International Classes:
G01B11/30; G01M11/00; G02B7/00; (IPC1-7): G01B11/30; G01M11/00; G02B7/00
Domestic Patent References:
JPS51138448A1976-11-30
JPS5924809A1984-02-08
JPS5764139A1982-04-19
Attorney, Agent or Firm:
Michio Oshima