Title:
AGING INSPECTION APPARATUS FOR CAPACITOR
Document Type and Number:
Japanese Patent JP3246154
Kind Code:
B2
Abstract:
PURPOSE: Tp provide an aging inspection apparatus, for a capacitor, whose costs can be lowered and which can be miniaturized regarding the aging inspection apparatus, for the capacitor, which is used when the leakage current of the capacitor is inspected.
CONSTITUTION: When an LC inspection and cooling part 11 is arranged at the outer circumferential part of a drum 15, a pallet conveyance part is eliminated, and the cost and the size of an apparatus can be reduced to 2/3 and 1/2, respectively, of those in conventional cases. In addition, several power-supply contacts are formed at one end of a pallet 13, they are connected to a power- supply part, a voltage is applied to a plurality of capacitors 17, and an aging operation is performed. As a result, the maintenance of the power-supply contacts can be performed easily, and it is possible to restrain a drop in the reliability, and an increase in the defect rate, of the aging operation and an LC inspection due to the defect of the power-supply contacts.
More Like This:
Inventors:
Hiroshi Kimura
Kenji Okura
Toshiaki Yamashita
Etsushi Kuratani
Kenji Okura
Toshiaki Yamashita
Etsushi Kuratani
Application Number:
JP564794A
Publication Date:
January 15, 2002
Filing Date:
January 24, 1994
Export Citation:
Assignee:
Matsushita Electric Industrial Co., Ltd
International Classes:
H01G13/00; (IPC1-7): H01G13/00
Domestic Patent References:
| JP63153812A | ||||
| JP55146060A | ||||
| JP6388816A |
Attorney, Agent or Firm:
Fumio Iwahashi (2 others)
Previous Patent: Tablet-shaped candy with the ability to improve bone density and joint function
Next Patent: anti-slip metal stairs
Next Patent: anti-slip metal stairs