PURPOSE: To improve reliability of plating bonding in irregularity of height direction of an inner lead by a method wherein a plurality of electrode pads are short-circuited by wiring pattern, and the potential from the lead terminal which is brought into contact with the electrode pads is applied to non-contact electrode parts too.
CONSTITUTION: The electrode pads 12 of a semiconductor chip 11 is short- circuited by a wiring pattern 11a. When the semiconductor chip 11 and a lead frame 13 are adhered, at least one of lead terminals 14 is brought into contact with one of the electrode pads 12. As a result, uniform potential can be applied to each electrode pad of the semiconductor chip 11 from the lead terminals 14 when a plating-bonding operation is conducted. Accordingly, potential is applied to each electrode pad 12 when a plating-bonding operation is conducted, highly efficient plated junction can be formed by the growth of a metal-plated layer 15 from both lead terminals 14 and the electrode pad 12, and the reliability of plating bonding can be improved.
OTAKI HIROKO
TSUKAMOTO TAKETO
TOKI SOTARO
TOPPAN PRINTING CO LTD