Title:
光学計測機器用フランジ付き超高真空観測窓の気密方法
Document Type and Number:
Japanese Patent JP4524388
Kind Code:
B2
Inventors:
Kasai Satoshi
Hiroaki Ogawa
Tatsuo Sugie
Fujisawa Tsuneshi
Hiroaki Ogawa
Tatsuo Sugie
Fujisawa Tsuneshi
Application Number:
JP2004150473A
Publication Date:
August 18, 2010
Filing Date:
May 20, 2004
Export Citation:
Assignee:
Japan Atomic Energy Agency
Limited company Fuji Idec
Limited company Fuji Idec
International Classes:
F16J15/04; G01N21/01; B01J3/03; B01J3/04; F16J15/08; F16J15/12
Domestic Patent References:
| JP63221832A | ||||
| JP1206163A | ||||
| JP7080274A | ||||
| JP1098767A | ||||
| JP3128172A |
Attorney, Agent or Firm:
Kazuo Shamoto
Shinjiro Ono
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Shurin Sakurai
Fujihiro Kanda
Hideo Tanaka
Shinya Hosokawa
Norihiro Fukasawa
Koji Hirayama
Tadashi Masui
Shinjiro Ono
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Shurin Sakurai
Fujihiro Kanda
Hideo Tanaka
Shinya Hosokawa
Norihiro Fukasawa
Koji Hirayama
Tadashi Masui