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Title:
ALPHA-RAY SCINTILLATION DETECTOR
Document Type and Number:
Japanese Patent JPH09264963
Kind Code:
A
Abstract:

To make it possible to detect only α-ray even under the environment where the α-ray and γ-ray are mixed by converting the wavelength band of fluorescence, and emitting wavelength converted fluorescence to the wavelength band of the high sensitivity wavelength band side of a pin photodiode.

When α-ray and γ-ray are externally incident to the scintillator 2 of ZnS (Ag) of α-ray measuring instrument 1, fluorescence responsive to the incident amount of the alpha-ray is emitted. The fluorescence is emitted as wavelength converted fluorescence via fluorescent glass 3 and pin photodiode 4. The pulse signal SP emitted from the diode 4 is amplified by an amplifier 5, noise is removed by comparator 6, and an output signal NSP is output to a counter 7. The counter 7 counts corresponding to the wavelength converted fluorescence based on the signal NSP, calculates the counted number corresponding only to the incident amount of the alpha-ray, and outputs the α-ray counted data DC to a process controller 9. As a result, the controller 9 variously processes based on the data DC and displays the result on a display 8.


Inventors:
IKETANI YOSHIFUMI
Application Number:
JP7719496A
Publication Date:
October 07, 1997
Filing Date:
March 29, 1996
Export Citation:
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Assignee:
YAZAKI CORP
International Classes:
G01T1/20; H01L31/09; (IPC1-7): G01T1/20; H01L31/09
Attorney, Agent or Firm:
Hideo Takino (1 outside)