Title:
AMMONIA ANALYZER
Document Type and Number:
Japanese Patent JP3464396
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To achieve increase in response speed and enhancement of analyzing accuracy, with a simple treatment technique, with respect to the gas contact surface of a sampling probe.
SOLUTION: In an ammonia analyzer based on a direct method and an indirect method, a sampling probe 9 used therein is impregnated in a 0.1N aq. soln. of NaOH, and the gas contact surface 9a of the probe 9 is treated to be brought to an alkali state so as not to generate reaction and adsorption of NH3 with respect to the gas contact surface 9a.
Inventors:
Takuji Ikuta
Masahiko Endo
Masahiko Endo
Application Number:
JP33007498A
Publication Date:
November 10, 2003
Filing Date:
November 20, 1998
Export Citation:
Assignee:
HORIBA, Ltd.
International Classes:
G01N31/00; G01N1/00; G01N1/02; G01N1/22; (IPC1-7): G01N31/00; G01N1/00; G01N1/02; G01N1/22
Domestic Patent References:
| JP7218493A | ||||
| JP20009603A | ||||
| JP10332668A | ||||
| JP78750U | ||||
| JP533050U |
Attorney, Agent or Firm:
Hideo Fujimoto