To generate analog characteristic data used for circuit evaluation in a short time.

Command data 2 are generated which include device information on a maker name, an article number, etc., specifying a device to be analyzed, analytic conditions such as temperature and a source voltage, the electronic constant of the device, and information on an internal buffer. An analog characteristic data generating program 1 reads the command data 2 out and generates input data 3 for a circuit simulator. The input data 3 are supplied to the simulator 4, which performs circuit simulation automatically and repeatedly under the analytic condition instructed with the input data 3 by using a transistor model 5 based upon the input data 3. A circuit simulator result 6 is passed to the analog characteristic data generating program 1 to generate analog characteristic data 7.