Title:
ANALYSIS APPARATUS AND AUTOMATIC ANALYSIS APPARATUS
Document Type and Number:
Japanese Patent JP2014202523
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To reduce influences by air bubbles and dusts on scattered light measurement with an automatic analysis apparatus.SOLUTION: A first wavelength 18a on a short wavelength side and a second wavelength 18b on a long wavelength side are emitted from a light source, and transmitted beams 19a, 19b and scattered beams 21a, 21b are received. Noise is estimated from a transmitted beam intensity ratio of the first wavelength and the second wavelength and from a change in amount of light of the scattered beam of the second wavelength. Subtraction is applied to a change in amount of light of the scattered beam of the first wavelength to reduce noise due to air bubbles and dusts.
Inventors:
YOGI TAKESHI
ADACHI SAKUICHIRO
YAMAZAKI SO
ADACHI SAKUICHIRO
YAMAZAKI SO
Application Number:
JP2013076932A
Publication Date:
October 27, 2014
Filing Date:
April 02, 2013
Export Citation:
Assignee:
HITACHI HIGH TECH CORP
International Classes:
G01N21/49; G01N35/00; G01N35/04
Domestic Patent References:
| JP2012007921A | 2012-01-12 | |||
| JPH0638947A | 1994-02-15 | |||
| JP2009085708A | 2009-04-23 | |||
| JP2003080253A | 2003-03-18 | |||
| JP2011237191A | 2011-11-24 |
Attorney, Agent or Firm:
Yusuke Hiraki
Mitsuo Sekiya
Toshiaki Watanabe
Mitsuo Sekiya
Toshiaki Watanabe
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