Title:
ANALYSIS METHOD FOR STATISTICAL ERRORS OF MEASURING DATA
Document Type and Number:
Japanese Patent JP2004325274
Kind Code:
A
Abstract:
To provide an analysis method for statistical errors of measuring data with less restrictions, which provides resolution better than conventional methods, and measures wide ranges with a cheap device.
The method comprises a statistics analysis step in which a center position μ, a spreading width σ, and statistical errors σ(μ) at the center position μ are statistically calculated from a plurality of measuring data Xi (1=1 to N, N is an integer not less than 2) , and an output step in which the calculated center position μ, spreading width σ, and statistical errors σ(μ) at the center position μ are output.
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Inventors:
MURATA JIRO
Application Number:
JP2003120934A
Publication Date:
November 18, 2004
Filing Date:
April 25, 2003
Export Citation:
Assignee:
RIKAGAKU KENKYUSHO
International Classes:
G01D1/00; G01B11/00; G01B21/00; (IPC1-7): G01B21/00; G01B11/00; G01D1/00
Domestic Patent References:
JPH07146113A | 1995-06-06 | |||
JPH06294621A | 1994-10-21 | |||
JP2001153617A | 2001-06-08 |
Attorney, Agent or Firm:
Minoru Hotta