分析システム、及び、保守点検支援装置

Japanese Patent JP5010474

B2

A complete test involving the entire number of devices in a large group of managed devices (T) is periodically performed to determine whether the devices are operating normally or have a malfunction; a test result (Ic) is recorded in a management database (Db) for each cycle of the complete test, and a device that has been found to be malfunctioning is repaired or replaced; and the suitability of a device model is determined or a suitable device model is selected for each of the managed devices (T) on the basis of history information (N) about each of the managed devices (T) obtained from the test result (Ic) of the complete test that spans a plurality of cycles, as recorded in the management database (Db).

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Yoshiyasu Fujiwara
Kazunori Oda

JP2007528484A

August 29, 2012

July 25, 2006

Click for automatic bibliography generation  

TLV Co., Ltd.

G06Q50/10; G01M99/00; G06Q50/04; F16K37/00; F16T1/48; G07C3/00

JPH08263319A	1996-10-11
JPS62246695A	1987-10-27
JPS6488892A	1989-04-03
JP2002140745A	2002-05-17
JP2003296475A	2003-10-17
JP2003083849A	2003-03-19

Shuichiro Kitamura
Mountain Saki Tetsuya

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