Title:
分析装置及び分析方法
Document Type and Number:
Japanese Patent JP6586997
Kind Code:
B2
Abstract:
An analysis device (1) includes a turntable (10) holding a substrate (60), an optical pickup (20) driven in a direction perpendicular to a rotation axis (C10) of the turntable (10) and configured to emit laser light (20a) to reaction regions (65) and to receive reflected light from the respective reaction regions (65), an optical pickup drive circuit (8), and a controller (9). The reaction regions (65) are formed at positions different from the center (Ca) of the substrate (60) . The center (Ca) of the substrate (60) is located on the rotation axis (C10) of the turntable (10). The optical pickup (20) detects a reception level of the reflected light to generate a light reception level signal (KS) . The controller (9) controls a turntable drive circuit (4) to rotate the substrate (60), controls the optical pickup drive circuit (8) to drive the optical pickup (20), and specifies the respective reaction regions (65) in accordance with a positional information signal (PS) and the light reception level signal (KS).
Inventors:
Shigehiko Iwama
Makoto Itonaga
Yuichi Hasegawa
Koji Tsujita
Masayuki Ono
Makoto Igarashi
Makoto Itonaga
Yuichi Hasegawa
Koji Tsujita
Masayuki Ono
Makoto Igarashi
Application Number:
JP2017542762A
Publication Date:
October 09, 2019
Filing Date:
March 18, 2016
Export Citation:
Assignee:
Jvc kenwood corporation
International Classes:
G01N33/543; G01N35/04; G01N37/00
Domestic Patent References:
| JP2009063310A | ||||
| JP2015127692A | ||||
| JP2012058019A | ||||
| JP2014219384A |
Foreign References:
| WO2003079013A1 |
Attorney, Agent or Firm:
Hidekazu Miyoshi
Shunichi Takahashi
Shunichi Takahashi