Title:
ANALYTICAL SYSTEM
Document Type and Number:
Japanese Patent JP3032159
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an analytical system capable of automatically inspecting an specimen in an analytical system in which different specimen vessels exist mixedly.
SOLUTION: Specimen vessels 10 received in a rack 20 are carried by a carrying line 130. An analytical unit 150 having a fractional mechanism 152 and an analytical unit 160 having a fractional mechanism 162 are arranged along the carrying line 130. A specimen vessel shape discriminating part 146 discriminates the shape of the specimen vessel, a control part 120 selects the fractional mechanism 152, 162 according to the inspected body, and hence the specimen sample is fractioned.
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Inventors:
Takashi Sakazume
Hiroshi Mimaki
Tomonori Mimura
Kazumitsu Kawase
Hiroshi Mimaki
Tomonori Mimura
Kazumitsu Kawase
Application Number:
JP25146996A
Publication Date:
April 10, 2000
Filing Date:
September 24, 1996
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
G01N35/02; G01N35/04; G01N35/10; G01N35/00; (IPC1-7): G01N35/10; G01N35/04
Domestic Patent References:
| JP344666U |
Attorney, Agent or Firm:
Kasuga
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