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Title:
ANALYZING METHOD, PROCESSING METHOD, AND ANALYZING PROGRAM FOR SPECTACLE LENS
Document Type and Number:
Japanese Patent JP2013250459
Kind Code:
A
Abstract:

To provide an analyzing method for spectacle lens that easily analyzes a passing position and an inset position of a corridor axis of a spectacle lens, a processing method for processing, and an analyzing program.

A light beam is emitted from one lens surface to the other lens surface of a spectacle lens manufactured based upon a prescription characteristic of a wearer, displacement of each light beam due to refraction is mapped to acquire refracting power data on each mapping point. An expression is applied to C-diopter data and astigmatic axis data of refracting power data on a straight line in a direction crossing a main sight line, and a function obtained from relation between a position on the straight line and a value obtained by application to the expression is subjected to second order differentiation to analyze the position of the main sight line.


Inventors:
WATANABE HIROAKI
Application Number:
JP2012125603A
Publication Date:
December 12, 2013
Filing Date:
June 01, 2012
Export Citation:
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Assignee:
TOKAI KOGAKU KK
International Classes:
G02C13/00; G01M11/02; G02C7/06
Domestic Patent References:
JP2005308642A2005-11-04
JP2005242346A2005-09-08
JPH11225959A1999-08-24
JPH08106992A1996-04-23
JP2007093636A2007-04-12
JP2012048004A2012-03-08
Attorney, Agent or Firm:
Junichi Shibata



 
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