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Patent Searching and Data


Title:
ANTISTATIC METHOD AND ANTISTATIC DEVICE USED IN SAME METHOD
Document Type and Number:
Japanese Patent JPH03194838
Kind Code:
A
Abstract:

PURPOSE: To prevent charge of the surface of a measuring object by supplying inert gas ion of low energy to the surface of the measuring object.

CONSTITUTION: In a surface analytical method, a charged ionized inert gas is flowed into the surface of a charged measuring object in parallel with the surface or at a fine angle of incidence with low energy. In other words, in case the surface of a measuring object is negatively charged, when a positive ion of positively ionized inert gas passes on the surface of the measuring object, the positive ion takes away the negative charge on the surface of the measuring object to be neutralized and becomes a neutral atom. Reversely, when the surface of the measuring object is positively charged, negatively ionized inert gas is made to flow on the surface of the measuring object. It is thereby possible to prevent simply and certainly the surface of the measuring object from being charged, so that an accurate spectrum can be obtained.


Inventors:
MATSUDA KYOJI
USUKI TOMOAKI
Application Number:
JP33408689A
Publication Date:
August 26, 1991
Filing Date:
December 22, 1989
Export Citation:
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Assignee:
SUMITOMO METAL IND
International Classes:
G01N23/00; H01J37/20; H01J37/252; H05F3/04; (IPC1-7): G01N23/00; H01J37/20; H01J37/252; H05F3/04
Attorney, Agent or Firm:
Ryuji Inouchi