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Patent Searching and Data


Title:
APPARATUS FOR COLLECTING SUSPENDED PARTICLE
Document Type and Number:
Japanese Patent JP2003337087
Kind Code:
A
Abstract:

To provide an apparatus for collecting suspended particle capable of collecting particles suspended in a gas by a specific particle diameter range and easily making the collected particles serve for microscopic observation and analyses by various analyzers.

The suspended particles in the gas in a charged state are introduced into a channel 13 in a direction which intersects, at right angles, the direction of an electric field formed in the channel 13. Through the use of the differences of the degrees of movements based on particle diameters, only particles P in a specific particle diameter range are extracted from a channel exit 16. A collecting container 21 in which a discharge electrode 23 and the dust collecting electrode 24 are arranged inside is connected to the channel exit 16 to collect the particles P to the surface of the dust collecting electrode 24 after the particles P have flown in the dust collecting container 21 from the channel exit 16 and classified. It is easier to extract the collected particles P than in the case of collection by a filter, and it is possible to easily make the particles by particle diameter range serve for microscopic observation, various analyses, etc.


Inventors:
Totoki, Shinichiro
Application Number:
JP2002000143974
Publication Date:
November 28, 2003
Filing Date:
May 20, 2002
Export Citation:
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Assignee:
SHIMADZU CORP
International Classes:
G01N15/02; B03C3/011; B03C3/02; B03C3/09; B03C3/155; B03C3/36; G01N1/02; (IPC1-7): G01N1/02; G01N15/02