Title:
APPARATUS FOR INSPECTING TWO-DIMENSIONAL NONUNIFORMITY
Document Type and Number:
Japanese Patent JPH0361805
Kind Code:
A
Abstract:
PURPOSE:To realize a two-dimensional estimating means for estimating more properly and simply formation of a sheet-like object sensuously by a method wherein an image of a specimen face is two-dimensionally recorded and the image data is displayed in a ternary value including an intermediate level with certain width and its upper and lower levels. CONSTITUTION:A specimen S is illuminated by light of a light source 1 wherein a few fluorescent lamps are arranged in parallel. At the time of measuring the specimen, while output of an image pickup device 3 is displayed on a monitor CRT 5, a frame 4 is vertically moved to adjust image pickup magnification. With the magnification determined, image data regarding the specimen is stored in an image memory 6 and data processing is started. During data processing, compensation with respect to nonuniformity of illumination is performed first, and two slice levels of upper and lower are specified for making the image data ternary. Once the slice levels are determined, the same slice levels may be used for a group of specimens to be correlatively compared with one another or an average is calculated per sample while a slice level is specified at a distance from the average by specific rate to make the image data ternary, so as to display the image data on a display CRT 8.
Inventors:
TANIGUCHI SHIGEO
OMATSU MASAMOTO
OMATSU MASAMOTO
Application Number:
JP19901689A
Publication Date:
March 18, 1991
Filing Date:
July 31, 1989
Export Citation:
Assignee:
KANZAKI PAPER MFG CO LTD
International Classes:
G01B11/30; G01N21/88; G01N21/89; G01N21/892; (IPC1-7): G01B11/30; G01N21/88; G01N21/89
Domestic Patent References:
| JPH0282144A | 1990-03-22 |
Attorney, Agent or Firm:
Kosuke Agata
Next Patent: JPH0361806