Title:
APPARATUS FOR MEASURING INFRARED-RAY RADIATION TEMPERATURE
Document Type and Number:
Japanese Patent JPH04188030
Kind Code:
A
Abstract:
PURPOSE:To determine the amount of light supplied into an infrared-ray detector excellently by moving a stop aperture having a specified size in the direction of an optical axis. CONSTITUTION:Infrared-rays 1a emitted from a material to be measured 1 are supplied into an objective lens 3 through a vertical scanning mirror 2V constituting a scanning part 2, a horizontal scanning mirror 2H and a fixed mirror 2b. The infrared rays 1a from the objective lens 3 is supplied into an infrared-ray detector 4 through a stop aperture 8b of a stop plate 8a of a stop plate device 8. The stop plate device 8 is formed of a sliding mechanism. The stop plate 8a is fixed with a movable part 8a of the sliding mechanism. The stop aperture 8b of the stop plate 8a having the specified size is arranged in coincidence with the optical axis of the infrared rays 1a. The stop aperture 8b is moved in the direction of the optical axis of the infrared rays 1a with a movable part 8c of the sliding mechanism.
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Inventors:
TAKAHARA NORIMITSU
Application Number:
JP31835890A
Publication Date:
July 06, 1992
Filing Date:
November 22, 1990
Export Citation:
Assignee:
NEC SAN EI INSTRUMENTS
International Classes:
G01J5/08; G01J5/48; (IPC1-7): G01J5/08; G01J5/48
Attorney, Agent or Firm:
Hidekuma Matsukuma