Title:
APPARATUS FOR MEASURING INTENSITY OF SCATTERING OF LIGHT
Document Type and Number:
Japanese Patent JP3234183
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To detect a scattering light in a wide angle range in a short time, by setting a reflecting mirror for reflecting and condensing the scattering light from a sample, forming an image of on a surface of the reflecting mirror at a point where the reflecting light is condensed, and recording the formed image.
SOLUTION: A laser apparatus 5 is provided which projects laser beams to a sample cell 1 through mirrors 2a, 2b, condenser lenses 3a, 3b and a pin hole 4. Moreover, an ellipsoidal mirror 6 for condensing a scattering light from a sample to an image formation lens 12, and an aperture 11 are arranged. The image formation lens 12 forms an image formed at a mirror face of the ellipsoidal mirror 6 to an image pickup face of a CCD camera 13. Because of a nature of a rotary elliptical body, light from one focus hits the ellipsoidal mirror 6 and converges to another focus. The one focus is set on the sample cell 1 and the other focus is set at the image formation lens 12. Angle dependency of the scattering light can be measured at one time in a wide angle range without moving elements constituting an optical system, so that time efficiency for the measurement is improved.
Inventors:
Kazunori Tsutsui
Koichi Oka
Koichi Oka
Application Number:
JP31875997A
Publication Date:
December 04, 2001
Filing Date:
November 19, 1997
Export Citation:
Assignee:
Otsuka Electronics Co., Ltd.
International Classes:
G01J1/04; G01N15/14; G01N21/47; G01N15/00; (IPC1-7): G01N15/14; G01J1/04; G01N21/47
Domestic Patent References:
| JP59122931A | ||||
| JP63243840A | ||||
| JP296636A | ||||
| JP62172242A | ||||
| JP3500815A |
Attorney, Agent or Firm:
Hirokatsu Kamei (1 person outside)