To provide a surface plasma resonance measuring instrument, using an intensity detecting method capable of accurately performing measurement, even if the intensity of the light source or the sensitivity of a detector is varied.
This surface plasmon resonance measuring apparatus is constituted so that the light 7 from the light source is thrown on a metal thin film 20 for holding a measurement sample at a predetermined angle via a medium and the total reflected light from the metal thin film 20 is detected by the detector 22, while a data processing means receives the measurement signal from the detector, to analyze the state of the measuring sample on the basis of a change in the intensity of the reflected light. A polarization plate 25 for fetching a P-wave and an S-wave is provided on the light path from the light source to the detector 22 and the data processing means receives the measuring signal from the detector due to the P-wave, while processing a fluctuation state using the measuring signal from the detector due to the S-wave to perform analysis, on the basis of the change in the intensity of the reflected light.
SHIMOYAMA ISAO
MATSUMOTO KIYOSHI
HOSHINO KAZUNORI
Ikuo Yamanaka
Akika Okado